Resistencia a la terapia antirretroviral en pacientes infectados con el virus VIH-1 en Chile 2002-2005

Afani S, Alejandro; Orellana R, Laura; Duarte J, Paula; ACEVEDO M, WILLIAM; Morales B, Ornar; Wolff R, Marcelo; Vásquez, Patricia; Beltrán, Carlos

Abstract

Background: Resistance limits the effectiveness of anti-retroviral therapy. In Chile, there is free access to highly active anti-retroviral therapy since 2001, but there is no information about the frequency of mutations associated to drug resistance. Aim: To determine the most common mutations associated to anti-retroviral drug resistance in Chile. Materials and Methods: Retrospective study of 710 genotype analysis coming from 568 patients aged 22 to 70 years (85% males) with virological failure. The analysis was performed using a commercially available sequencing kit (Trugene HIV-1 genotypic assay from Bayer S.A). Results: Mean CD4+ cell count and viral load were 154 cells/fil and 228784 RNA copies/ml, respectively. The frequency of resistance to nucleoside RT inhibitors (NRTI), non nucleoside RT inhibitors (NNRTI) and protease inhibitors (PI) was 71 %, 62% and 22%, respectively. The most common mutations found were T215Y (46%), L10F (44%), Ml84V (3896), K103N (35%) and M41L (32%). Fifty five percent of mutations corresponded to the TAM (thymidine analogue mutations) group. Multiresistance was 47% to NNRTI, 7% to NRTI, 4% to PI and 0.7% to all groups. During the four years of the study, there was a significant increase in NNRTI resistance. Conclusions: These data provides important information about the epidemiology of drug resistance mutations and should help to design newHAARTstrategies

Más información

Título según SCIELO: Resistencia a la terapia antirretroviral en pacientes infectados con el virus VIH-1 en Chile 2002-2005
Título de la Revista: REVISTA MEDICA DE CHILE
Volumen: 135
Número: 10
Editorial: Sociedad Médica de Santiago
Fecha de publicación: 2007
Página de inicio: 1237
Página final: 1244
Idioma: es
URL: http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0034-98872007001000002&lng=en&nrm=iso&tlng=en
DOI:

10.4067/S0034-98872007001000002

Notas: SCIELO